片上网络路由器的测试及其外壳旁路故障的诊断

目前采用IEEE 1500测试外壳的方法可以一定程度上解决NoC(Netword on Chip)路由器测试的问题,但当测试外壳的旁路出现一个以上的故障时,很可能导致一整条扫描链上的NoC路由器测试失败.针对该问题,本文通过提出一个深度优先最短路径算法得到从固定的扫描输入端到扫描输出端的最短路径,并通过提出的递归划分逐步求精法对路径进行筛选分块排序,构造多条扫描测试链将整个网络中的路由器分开测试.本文给出了测试外壳旁路故障的诊断和容错方法,使用节点分类测试方法实现对NoC路由器旁路故障的定位,并通过本文提出的测试外壳结构实现对故障旁路的容错.

Test for NoC Routers and Diagnose for Bypass of Its Test Wrapper

The IEEE 1500 standard structure provides a test wrapper to test routers and a bypass to shield faulty routers.However,if a bypass fails,not only we cannot use it to tolerate fault,but also it will disturb other test responses in the same scan chain.To solve the problem,we propose a diagnostic method for bypass fault in routers' test wrapper in NoC.We use the Depth-first shortest path to get the shortest path from the scan-in port to the scan-out port,and we separate routers by using recursive partitioning stepwise refinement to construct multiple scan test chains.So the localization of bypass fault could be realized.Then we also propose an architecture to tolerate the bypass fault.