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45nm低功耗、高性能Zipper CMOS多米诺全加器设计
引用本文:汪金辉,宫娜,耿淑琴,侯立刚,吴武臣,董利民.45nm低功耗、高性能Zipper CMOS多米诺全加器设计[J].电子学报,2009,37(2).
作者姓名:汪金辉  宫娜  耿淑琴  侯立刚  吴武臣  董利民
作者单位:[1]北京工业大学集成电路与系统研究室,北京100022 [2]河北大学电子信息工程学院,河北保定071002
摘    要:提出了电荷自补偿技术,此技术利用P型多米诺电路动态结点的放电对N型多米诺电路的动态结点充电,并在此技术基础上综合应用双阈值技术和多电源电压技术,设计了新型低功耗、高性能Zipper CMOS多米诺全加器.仿真过程中提出了功耗分布法,精确找到了电荷自补偿技术的最优路径.仿真结果表明,在相同的时间延迟下,与标准Zipper CMOS多米诺全加器、双阈值Zipper CMOS多米诺全加器、多电源电压Zipper CMOS多米诺全加器相比,新型Zipper CMOS多米诺全加器动态功耗分别减小了37%、35%和7%,静态功耗分别减小了41%,20%和43%.最后,分析并得到了新型全加器漏电流最低的输入矢量和时钟状态.

关 键 词:动态功耗  静态功耗  漏电流  Zipper  CMOS多米诺全加器  电荷自补偿技术

Low Power and High Performance Zipper CMOS Domino Full-Adder Design in 45nm Technology
WANG Jin-hui,GONG Na,Geng Shu-qin,HOU Li-gang,WU Wu-chen,DONG Li-min.Low Power and High Performance Zipper CMOS Domino Full-Adder Design in 45nm Technology[J].Acta Electronica Sinica,2009,37(2).
Authors:WANG Jin-hui  GONG Na  Geng Shu-qin  HOU Li-gang  WU Wu-chen  DONG Li-min
Affiliation:1.VLSI and System Laboratory;Beijing University of Technology;Beijing 100022;China;2.College of Electronic and Informational Engineering;Hebei University;Baoding;Hebei 071002;China
Abstract:A charge self-compensation techniques,based on the dynamic node of the P-type charging dynamic node of N-type,is proposed in this paper.Utilizing this technique,the dual-threshold voltage techniques and the multiple supply voltages techniques a low power and high performance Zipper CMOS domino full-adder is designed.And a novel method of the power distribution is introduced.With this method,the optimal path of the proposed Zipper CMOS full-adder with the charge self-compensation techniques is found accurate...
Keywords:active power  static power  leakage current  Zipper CMOS domino full-adder  charge self-compensation techniques  
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