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An analytical parasitic resistance dependent IdVd model for planar doped InAlAs/InGaAs/InP HEMT using non-linear charge control analysis
Authors:Ritesh Gupta  Abhinav Kranti  S Haldar  Mridula Gupta  R S Gupta  
Affiliation:

a Semiconductor Device Research Laboratory, Department of Electronic Science, University of Delhi South Campus, New Delhi 110 021, India

b Motilal Nehru College, University of Delhi, Benito Juarez Road, New Delhi 110 021, India

Abstract:An analytical parasitic resistance dependent model for the current voltage characteristics for InAlAs/InGaAs/InP HEMT is proposed. The model uses a new polynomial dependence of sheet carrier concentration on gate voltage to calculate IdVd characteristics and has been extended to obtain transconductance, output conductance and cut-off frequency of the device. A maximum cut-off frequency of 83 and 175 GHz was obtained for channel length of 0.25 and 0.1 μm, respectively. Close agreement with published results confirms the validity of our approach.
Keywords:InAlAs/InGaAs heterostructure  InP-based HEMT  Planar doped  Parasitic resistances  IdVd characteristics  Transconductance  Output conductance  Cut-off frequency
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