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基于t分布的电子装备测试样本选取方法
引用本文:段绍展,刘光辉.基于t分布的电子装备测试样本选取方法[J].电子信息对抗技术,2014(5):78-80.
作者姓名:段绍展  刘光辉
作者单位:解放军91404部队,秦皇岛,066001
摘    要:测试样本选取是装备测试工作的一项重要内容,理想的测试样本是在高置信度的前提下用尽量少的测试次数得到的,要同时兼顾质量和效率。为此,针对电子装备测试的特殊性,运用数理统计的方法,从理论上对样本数量进行了探讨,得到了相应的计算方法,并举例验证该方法有一定的理论价值。

关 键 词:测试样本  t分布函数  样本估计值

Extraction Methods of Electronic Equipment Test Sample Based on T-Distribution
Authors:DUAN Shao-zhan  LIU Guang-hui
Affiliation:( Unit 91404 of PLA, Qinhuangdao 066001, China)
Abstract:The test sample selection is an important content of equipment testing. The ideal test sample is achieved in the premise of high reliability with less testing times as far as possible, both high quality and high efficiency should be taken into account. So in view of the special electronic equipment test, using the method of mathematical statistics, how to get the ideal test sample is discussed from the theory, the corresponding calculation method is illustrated. The viewpoint proposed is novel, informative, has some theory value.
Keywords:test sample  t distribution function  sample estimates
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