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显像(示)管阴极像黑洞状缺陷形成的原因及消除对策
引用本文:李贵民.显像(示)管阴极像黑洞状缺陷形成的原因及消除对策[J].真空电子技术,1998(6):51-55.
作者姓名:李贵民
作者单位:大连大显股份有限公司
摘    要:本文通过有关理论依据和试验数据,着重阐述了在显像(示)管测试中,阴极像中心黑洞状缺陷产生的原因以及消除这种缺陷的处理方法。通过这种处理方法处理过的显像(示)管,其整体质量水平(尤其是真空度)将会得到明显的提高。

关 键 词:显像(示)管,阴极像,CC缺陷,真空度,吸气剂,电子流,离子流

The Causes of Black-Hole-Like Defectsin the Cathode Image Center and Removing Methods
Li Guimin.The Causes of Black-Hole-Like Defectsin the Cathode Image Center and Removing Methods[J].Vacuum Electronics,1998(6):51-55.
Authors:Li Guimin
Abstract:ln this paper, by presenting theory evidences and testing data concerned , the causes of black-hole-1ike defects in the cathode image center (CC) ,during picture tube (display tube ) testing ,and the methods of removing these defects are described. Through these methods the general quality level of the picture tube (display tube ) , particularly the vacuity , has been re- markable increased.
Keywords:Picture tube (display tube)  Cathode image  CC defect  Vacuity  Getter  Electron flow  lon flow
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