| 几种电子元器件长期储存的失效模式和失效机理 |
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| 引用本文： | 李坤兰.几种电子元器件长期储存的失效模式和失效机理[J].电子产品可靠性与环境试验,2000(6):30-33. |
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| 作者姓名： | 李坤兰 |
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| 作者单位： | 信息产业部电子第五研究所 广东 |
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| 摘 要： | 通过对几种元器件长期储存期间的失效进行分析，探讨了这几种元器件的失效模式及其失效机理。
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| 关 键 词： | 电子元器件 失效模式 失效机理 长期储存 |
Failure Modes and Failure Mechanisms of Several Electronic Components |
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| LI Kun-lan.Failure Modes and Failure Mechanisms of Several Electronic Components[J].Electronic Product Reliability and Environmental Testing,2000(6):30-33. |
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| Authors: | LI Kun-lan |
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| Abstract: | Failure modes and their failure mechanisms for severla electronic component in long - term storage were investigated by failure analysis. |
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| Keywords: | electronic component failure mode failure mechanism long - term storage |
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