| 星用微波组件低气压放电与真空微放电效应研究 |
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| 引用本文： | 刘中华,;李树杰.星用微波组件低气压放电与真空微放电效应研究[J].电子产品可靠性与环境试验,2014(4):4-7. |
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| 作者姓名： | 刘中华 ;李树杰 |
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| 作者单位： | [1]中国电子科技集团公司第十三研究所,河北石家庄050051; [2]中国电子科技集团公司电子可靠性工程技术有限公司,北京100083 |
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| 摘 要： | 低气压放电效应与真空微放电效应(亦被称为电子二次倍增效应)是装载在航空器或航天器上的星用微波组件在上天过程中与正常定轨后工作所要经历的两个阶段,经历发射至定轨工作的全过程(亦被称为入轨)的星用微波组件要经历低气压放电的考验,而对定轨后运行的星用微波组件则要经受真空微放电的考验。其放电机理和环境条件各异,两种环境试验不具有互换性,对此进行了研究;并对低气压放电与真空微放电提出了相应的防护措施。
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| 关 键 词： | 星用微波组件 低气压放电 真空微放电 电子二次倍增效应 |
Research on Low Pressure Discharge and Vacuum Microdischarge Effects of Satellite-borne Microwave Modules |
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| Affiliation: | LIU Zhong-hua,LI Shu-jie(1.The 13th Research Institute of CETC, Shijiazhuang 050051, China; 2.The Electronic Reliability Engineering Technology Co., Ltd., CETC, Beijing 100083, China) |
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| Abstract: | The de-pressure discharge phenomena and vacuum micro discharge phenomena（ electronic quadratic multiplication effect） are thetwo stages that the satellite-borne microwave modules loaded on the aircraft or spacecraft must experience in the lift-off process and after the normal orbit determination. Microwave modules are subject to low pressure discharge from the launch to orbit determination, and vacuum micro discharge after the orbit determination. The mechanism and environmental conditions for these two phenomena are different, and these two kinds of environmental tests are not interchangeable. The respective protective measures against low-pressure discharge and vacuum micro discharge are presented. |
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| Keywords: | satellite-borne microwave component de-pressure discharge vacuum micro dis-charge electronic quadratic multiplication effect |
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