基于FDR码改进分组的SoC测试数据压缩方法

文章提出一种基于FDR码改进分组的SoC测试数据压缩方法.经过对原始测试集无关位的简单预处理,提高确定位0在游程中的出现频率.在FDR码的基础上,改进其分组方式,通过理论证明其压缩率略高于FDR编码,尤其是短游程的压缩率.用C语言编写程序模拟两种编码方法的软件实现程序,实验结果证明了改进分组的FDR编码方法的有效性和高压缩性.

Improved groups test data compression technique based on FDR codes in SoC

This paper proposed the improved groups test data compression technique based on FDR codes in SoC. The frequency of zero number＇s occurrence was increased by pretreating don＇t care bits in the original test set. The new technique improve groups of the FDR codes has higher compression ratio than FDR codes. We can prove the theory by scientific calculating. It can substantially reduce the compression of short runs. The two codes methods simulated by C language. Experimental results show that the method can efficiently compress test data and outperform FDR codes.