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Cost-effective test solutions for smart card and other integrated flash applications |
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| Authors: | Thomas MTrexler |
| Abstract: | (continuing from 2004.5-page 67) Low-Cost Platform Test platform flexibility is particularly important for emerging flash applications like ISO 14443-compliant cards. With conventional mainframe-based test architectures, manufacturers need to make a significant investment in the tester mainframe and a complete pin electronics package before they could test even a single device. |
| Keywords: | applications flash integrated smart card solutions need make significant investment tester complete electronics package single device conventional Test flexibility like cards |
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