| 基于March C-算法的SRAM BIST电路的设计 |
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| 引用本文： | 须自明,苏彦鹏,于宗光. 基于March C-算法的SRAM BIST电路的设计[J]. 半导体技术, 2007, 32(3): 245-247 |
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| 作者姓名： | 须自明 苏彦鹏 于宗光 |
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| 作者单位： | 江南大学信息工程学院,江苏无锡,214000;江南大学信息工程学院,江苏无锡,214000;中国电子科技集团公司第五十八研究所,江苏无锡,214035 |
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| 基金项目： | 电子元器件可靠性物理及其应用技术国防科技重点实验室资助项目 |
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| 摘 要： | 针对某SOC中嵌入的8K SRAM模块,讨论了基于March C-算法的BIST电路的设计.根据SRAM的故障模型和测试算法的故障覆盖率,研究了测试算法的选择、数据背景的产生,并完成了基于March C-算法的BIST电路的设计.实验证明,该算法的BIST实现能大幅提高故障覆盖率.
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| 关 键 词： | 静态存储器 March C-算法 内建自测试 |
| 文章编号： | 1003-353X（2007）03-245-03 |
| 修稿时间： | 2006-08-09 |
SRAM BIST Circuit Design Based on the March C-Algorithm |
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| XU Zi-ming,SU Yan-peng,YU Zong-guang. SRAM BIST Circuit Design Based on the March C-Algorithm[J]. Semiconductor Technology, 2007, 32(3): 245-247 |
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| Authors: | XU Zi-ming SU Yan-peng YU Zong-guang |
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| Affiliation: | 1. SIT of Southern Yangtze University, Wuxi 214000, China; 2. The 58th Research Institute CETC , Wuxi214035, China |
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| Abstract: | According to the 8K SRAM module of SOC,a BIST(built in self test) circuit design based on the March C-algorithm was discussed.The choose of the test algorithm,the generation of the database were studied,and the main part of the BIST design was worked out,based on the fault models of SRAM and the fault coverage of the test algorithm.The conclusions prove that the approach can improve the fault coverage obviously. |
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| Keywords: | SRAM March C-algorithm BIST |
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