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BOARD-LEVEL BUILT-IN SELF-REPAIR METHOD OF RAM |
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| Authors: | Dou Yanjie Zhan Huiqin Chen Yakun Shang Hongliang |
| Affiliation: | Department of Automation Engineering, Univevsity of Electronic Science and Technology of China,Chengdu 611731, China |
| Abstract: | |
| Keywords: | RAM testing Built-in self-repairing Faulty address mapping Function test |
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