Modeling boron diffusion in thin-oxide p+ Si gatetechnology |
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Authors: | Fair RB Gafiteanu RA |
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Affiliation: | Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC; |
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Abstract: | A network defect model suitable for use in process simulation is presented for the diffusion of B in SiO2 and, in particular, B in the presence of F and H2. We find that B diffuses via a peroxy linkage defect the concentration in the oxide of which changes under different processing conditions. From random walk theory it is possible then to calculate the resulting diffusion coefficients. These results are compared with measured diffusivities and empirical adjustments are made |
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