首页 | 本学科首页   官方微博 | 高级检索  
     

基于镜像射线跟踪法的电波暗室仿真设计
引用本文:韩曹政,张振林,曹胜利,程璟星,宫 剑.基于镜像射线跟踪法的电波暗室仿真设计[J].微波学报,2018,34(5):67-72.
作者姓名:韩曹政  张振林  曹胜利  程璟星  宫 剑
作者单位:中国电子科技集团公司第三十三研究所电磁防护部件与检测事业部,太原 030032
摘    要:为提升暗室吸波工程的设计能力,运用镜像射线跟踪法对10 m 法电波暗室进行仿真设计,通过合理布置吸波材料,考虑一次反射和二次反射对静区的影响,计算了不同极化方式下静区的反射电平、归一化场地衰减和场均匀性。结果表明垂直极化和水平极化时,场地电压驻波比仿真与测试偏差小于2.3 dB;归一化场地衰减仿真与测试误差小于3 dB,场均匀性误差小于2 dB。仿真与测试结果吻合较好,各项指标均满足设计要求,验证了吸波材料布局的合理性及算法的可靠性。该仿真方法可应用于暗室静区性能评估,优化吸波材料布局,进而有效缩短设计周期。

关 键 词:电波暗室  射线跟踪  静区  反射电平  归一化场地衰减(NSA)    场均匀性(FU)

Simulation and Design of Anechoic Chamber Based on Image Ray-Tracing Method
HAN Cao-zheng,ZHANG Zhen-lin,CAO Sheng-li,CHENG Jing-xing,GONG Jian.Simulation and Design of Anechoic Chamber Based on Image Ray-Tracing Method[J].Journal of Microwaves,2018,34(5):67-72.
Authors:HAN Cao-zheng  ZHANG Zhen-lin  CAO Sheng-li  CHENG Jing-xing  GONG Jian
Affiliation:Department of Electromagnetic Shielding Component and Test, No.33 Institute of China Electronic Technology Group Corporation,Taiyuan 030032, China
Abstract:In order to improve the design capability of absorber engineering of chamber, this paper applied image ray-tracing method to simulate and design a 10-meter anechoic chamber. By means of assigning absorber reasonably and considering the influence of first and second reflections on the quiet zone, the reflectivity level, normal site attenuation(NSA) and field uniformity(FU) were calculated in different types of polarization. Results show that in both vertical and horizontal polarization, the deviation of site VSWR between simulation and test is less than 2.3 dB, the error of NSA is less than 3 dB, and the error of FU is less than 2 dB. Simulation coincides with measurement results well, and all parameters meet requirements of anechoic chamber, verifying that the layout of absorber was reasonable and this algorithm was reliable. The proposed method can apply to estimate quiet zone performance, optimize the arrangement of absorber, thus shorten design period effectively.
Keywords:anechoic chamber  ray tracing  quiet zone  reflectivity level  normal site attenuation(NSA)  field uniformity(FU)
点击此处可从《微波学报》浏览原始摘要信息
点击此处可从《微波学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号