InSb焦平面探测器高低温循环特性研究 |
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引用本文: | 王洋,鲁星,孟超,刘俊明,邝永变,孟庆端,朱旭波,司俊杰.InSb焦平面探测器高低温循环特性研究[J].红外与激光工程,2015,44(12):3701-3706. |
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作者姓名: | 王洋 鲁星 孟超 刘俊明 邝永变 孟庆端 朱旭波 司俊杰 |
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作者单位: | 1.中国空空导弹研究院,河南 洛阳 471099; |
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基金项目: | 国家自然科学基金(YGZJJ02) |
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摘 要: | 制冷型InSb红外焦平面探测器工作时需降温至低温(80 K),器件在整个生命周期会经受从常温(300 K)到低温(80 K)的上千次高低温循环。针对该型探测器开展了高低温循环特性试验,测试和分析了上千次高低温循环过程中器件光电性能、杜瓦热负载和J-T制冷器特性的变化。试验结果表明,探测器可以经受至少2 000次高低温循环,并且探测率变化的幅度5.5%、响应率变化的幅度4.8%、盲元数未发生增加。研究结果为器件的工艺研发和改进提供了参考。
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关 键 词: | InSb焦平面探测器 高低温循环 参数变化 可靠性 |
收稿时间: | 2015-04-17 |
Thermal cycle characteristic of InSb focal plane array detector |
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Affiliation: | 1.China Airborne Missile Academy,Luoyang 471099,China;2.PLA's Military Representative Office in China Airborne Missile Academy,Luoyang 471099,China;3.Aviation Key Laboratory of Science and Technology on Infrared Detector,Luoyang 471099,China;4.Electronics and Information Engineering College,Henan University of Science and Technology,Luoyang 471003,China |
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Abstract: | The cooled InSb infrared focal plane array(IRFPA) detectors should work in the temperature as low as 80 K. As a result, detectors are commonly subjected to thousands of thermal cycle from 80 K to room temperature(300 K) in the entire life cycle. Thermal cycle characteristic of the InSb IRFPA detector was studied. The FPA photoelectric parameter, Dewar heat load and J-T cooling characteristics were analyzed. The results indicated that the maximal fluctuation of the detectivity was 5.5%, the maximal fluctuation of the responsivity was 4.8%, and the number of dead pixels did not increase. The experimental results exhibited that the detectors could undergo at least 2 000 thermal cycles, which provides reference for the research and improvement of detector fabrication. |
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