| 逐行复位快闪式CMOS 焦平面读出电路的测试方法 |
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| 引用本文： | 高 峻,陈中建,鲁文高,吉利久,赵建忠 董 硕.逐行复位快闪式CMOS 焦平面读出电路的测试方法[J].激光与红外,2004,34(6):460-463. |
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| 作者姓名： | 高 峻 陈中建 鲁文高 吉利久 赵建忠 董 硕 |
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| 作者单位： | 1. 北京大学微电子研究院,北京,100871
2. 华北光电技术研究所,北京,100015 |
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| 基金项目： | 电子预先研究项目支持 ( 4 13 0 80 2 0 10 2 ) |
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| 摘 要： | 介绍了一种逐行复位快闪CMOS 焦平面读出电路的测试方法及测试结果。该电路基于电荷转移原理,采用逐行复位方式。基于测试考虑,设计了模拟光电流的测试管,和可调节的工作时序。设计了一种新的测试方法测量出了内部寄生参量。除此以外对电路的其他重要参数进行了详细测量。
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| 关 键 词： | 焦平面 读出电路 测试方法 |
| 文章编号： | 1001-5078(2004)06-0460-04 |
Testing Method of Reset Row-by-row Snapshot Charge Amplifier CMOS Readout IC for Focal Plane Array |
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| GAO Jun,CHEN Zhong-jian,LU Wen-gao,JI li-jiu,ZHAO Jian-zhong,DONG Shuo.Testing Method of Reset Row-by-row Snapshot Charge Amplifier CMOS Readout IC for Focal Plane Array[J].Laser & Infrared,2004,34(6):460-463. |
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| Authors: | GAO Jun CHEN Zhong-jian LU Wen-gao JI li-jiu ZHAO Jian-zhong DONG Shuo |
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| Affiliation: | GAO Jun~1,CHEN Zhong-jian~1,LU Wen-gao~1,JI li-jiu~1,ZHAO Jian-zhong~2,DONG Shuo~2 |
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| Abstract: | The testing method and measurement results of RRSCA(Reset Row-by-row Charge Amplifier) are presented in this paper. That circuit works based on charge transfer principle and resets row by row. For testing ,test MOSFETs are inserted for testing to simulate the photo current ,and the circuit timing can be adjusted to change the work mode. A novel testing method is introduced for measuring the inner parasitic parameters. The other important parameters are also measured. |
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| Keywords: | FPA readout IC testing method |
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