| 存储器内建自测试的程序控制方法 |
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| 引用本文： | 刘蓬侠,鲁建壮.存储器内建自测试的程序控制方法[J].微电子学与计算机,2011,28(3). |
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| 作者姓名： | 刘蓬侠 鲁建壮 |
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| 作者单位： | 国防科学技术大学计算机学院,湖南,长沙,410073 |
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| 基金项目： | 教育部"高性能微处理器技术"创新团队基金 |
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| 摘 要： | 文中提出了一种利用处理器的指令系统编写特定程序,通过程序运行来控制完成整个存储器内建自测试过程的方法.基于此方法的设计已经成功应用于一款处理器中,有效地提高了芯片的可测试性和应用系统的容错性.
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| 关 键 词： | 存储器 内建自测试 指令系统 程序 |
A Program-Controlled Method for Memory BIST |
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| LIU Peng-xia,LU Jian-zhuang.A Program-Controlled Method for Memory BIST[J].Microelectronics & Computer,2011,28(3). |
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| Authors: | LIU Peng-xia LU Jian-zhuang |
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| Affiliation: | LIU Peng-xia,LU Jian-zhuang(School of Computer Science,National University of Defense Technology,Changsha 410073,China) |
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| Abstract: | In this article,we opened a kind of novel method.Differed from the current methods which use I/O pins of a processor,this mehtod used the system instruction of a processor to design the special program,which controls the whole process of memory BIST.This method effectively enhanced the testability of the chip and the fault tolerability of an application system,and it has been used in a real chip successfully. |
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| Keywords: | memory BIST instruction system program |
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