模拟集成电路版图中的对称检测与提取方法

新一代模拟集成电路版图自动化系统在重用原有版图时,迫切需要提取其中的匹配设计信息,以保证其输出版图的质量.在角勾链数据结构的基础上,提出了新的对称检测、提取算法及数据结构.该算法检测出器件之间的对称关系,进一步提取出模块之间的对称关系,并将器件级和模块级对称关系及底层的角勾链结构以独特的数据结构统一存储.结果表明,该算法与数据结构能够有效地提取并表示设计者在版图中渗透的匹配设计思想,为版图的生成提供多级对称约束条件,从而有力地保证重用系统所输出的模拟版图的性能.

Symmetry Detection and Extraction in Analog IC Layout

The symmetry information embedded in the analog integrated circuit layout is currently in great need to be extracted for the new generation analog layout automation systems to guarantee the quality of their output layout. A new algorithm and a related data structure are proposed in this paper to detect, extract and denote the symmetry information. The algorithm detects the symmetry relationships between devices, and hence extracts the relationships between device dusters; the data structure is used accordingly to store the comer stitching structure, device and cluster level symmetry in a unique and uniform pattern. They are able to extract and denote the matching information embedded in the analog layout, and provide the multi- level symmetry constraints for layout regeneration so as to guarantee the performance of the analog layout generated by the recycling system.