| 针对基于中国剩余定理RSA算法的光故障攻击分析 |
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| 引用本文： | 王红胜,宋凯,张阳,陈开颜.针对基于中国剩余定理RSA算法的光故障攻击分析[J].微电子学与计算机,2012,29(1):38-41. |
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| 作者姓名： | 王红胜 宋凯 张阳 陈开颜 |
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| 作者单位： | 军械工程学院计算机工程系,河北石家庄,050033 |
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| 基金项目： | 国家自然科学基金项目，军械工程学院原始创新基金 |
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| 摘 要： | 基于中国剩余定理的RSA算法在智能卡和密码系统中得到广泛的应用,其安全性直接关系到人们的利益.本文使用一种简单的方法对密码芯片进行光故障注入,通过激光照射开封后的芯片,影响密码系统加密过程,获取芯片内部的秘密信息.实验说明对运行基于中国剩余定理RSA算法的密码芯片存在安全隐患.
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| 关 键 词： | 故障注入 旁路攻击 中国剩余定理 密码芯片 |
Optical Fault Attack on CRT-Based RSA |
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| WANG Hong-sheng,SONG Kai,ZHANG Yang,CHEN Kai-yan.Optical Fault Attack on CRT-Based RSA[J].Microelectronics & Computer,2012,29(1):38-41. |
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| Authors: | WANG Hong-sheng SONG Kai ZHANG Yang CHEN Kai-yan |
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| Affiliation: | (Department of Computer Engineering,Ordnance Engineering College,Shijiazhuang 050003,China) |
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| Abstract: | The Chinese Remainder Theorem(CRT)based RSA algorithm is very suitable in smartcard and cryptosystem,however the security benefit people’s interest.This paper showed a method to practice an optical injection in cryptographic device.The attack was used laser irradiation the depackaged device to impact cryptographic computation process,obtained the secret information from the inside of chip.This paper presented implementation CRT-RSA algorithm in cryptographic device existed security issue. |
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| Keywords: | fault injection side channel attack CRT cryptographic chip |
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