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V777测试系统DA/AD测试技术的研究
引用本文:陆强,孙晓丽.V777测试系统DA/AD测试技术的研究[J].电子与封装,2008,8(8):13-17.
作者姓名:陆强  孙晓丽
作者单位:无锡华润矽科微电子有限公司,江苏,无锡,214061
摘    要:文章以V777测试系统为平台,用虚拟测试方法和DSP的思想来模拟数模混合测试仪的工作机制,包括激励的产生、响应的采集、数据处理和为DUT提供的测试波形的组合响应处理。利用V777测试系统PMU端口可并行测试的功能获取待测电路AD模块的8位输出,在误差允许范围内匹配其理论对应值。在低频下,利用PMU对DA端口模拟信号的输出进行采样,对采样得到的数据做数字信号算法处理,实现波形的判断。用上述方法以低成本来实现具有一定难度的电路的测试。

关 键 词:测试系统  DUT  DSP  ADC  DAC  PMU  FFT

Research on Test Technology of DMAD on V777 Test System
LU Qiang,SUN Xiao-li.Research on Test Technology of DMAD on V777 Test System[J].Electronics & Packaging,2008,8(8):13-17.
Authors:LU Qiang  SUN Xiao-li
Affiliation:( Wuxi China Resources Semico Microelectronics Co., Ltd, Wuxi 214061, China)
Abstract:This paper,based on V777 test system,simulating the working principle of ATE by virtual method and DSP. Such as production of input,collection of output, data processing and dealing with compound response of test pattern for DUT. In this paper AD’S 8 bits output signal is obtained making use of the parallel test function of PMU on V777 test system, then the obtained value is matched with theory value set before under permission error. DA’s analog output signals are sampled by PMU, then the output signals are analyzed using DSP arithmetic to judge the waveform under low frequency. Aiming at successful test of complicated circuit in low cost using these methods above.
Keywords:DUT  DSP  ADC  DAC  PMU  FFT
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