一种精确测量AC-DC电源管理类芯片的方法

对于AC-DC电路测试,圆片测试(CP)一般采用开环测试的方法,测试项目较少,从而使CP的测试时间大大减少,提高了测试效率以及测试产能。CP测试的目的是测试基准电压以及输出波形等参数,并对相应参数进行工艺上的修调,使得这些参数达到中心值,保证芯片基本功能的准确;但CP测试并不是应用环境下的芯片状态,所以当AC-DC电路进行成品测试(FT)的时候,通过模拟芯片的应用环境来测试芯片在应用端的参数,从而确保芯片在工作环境中能正常应用,达到检测芯片的目的。主要介绍了AC-DC电路在闭环应用环境下各项参数的测试方法,确保电路功能的稳定性以及可靠性。

A Skillful Technology for Low MOSFETRDS(ON) Testing

For the AC-DC circuit testing, chip probing test(CP)generally uses the method of the open loop test, test parameter is less, so that the test time of CP is greatly reduced, improving test efficiency and test capacity, the CP test is designed to test the reference voltage and the output waveform parameters, and the corresponding parameters of process on the trimming, these parameters to achieve the central value, guarantee the basic functions of chip accurately, but the CP test is not applied environment of the chip, so when the circuit of AC-DC final testing(FT), the application environment, through the simulation of chip, parameters to test chip on the application side, so as to ensure that the chip in the work environment the normal application, achieve the purpose of detection chip. The paper mainly introduces the application of AC-DC circuit in the close-loop environment, the testing method of the parameters of the circuit function, to ensure the stability and reliability.