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| 微小相位延迟的检测 | |
| 引用本文： | 刘同佩,张耐.微小相位延迟的检测[J].应用激光,1992(2). |
| 作者姓名： | 刘同佩 张耐 |
| 作者单位： | 上海大学工学院三系 200032(刘同佩)，上海师范大学实验中心 200234(张耐) |
| 摘 要： | 报道一种测量微小光学相位延迟的新方法,测定装置简单而且精度高,用于测量PLZT等薄膜材料的克尔系数。 |
| 关 键 词： | 相位延迟 电光效应 PLZT薄膜 |
Precise Measurement of Small Phase Delay |
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| Liu Tongpei,Zhang Nai Engineering College,Shanghai University Central Laboratory Shanghai Normal University.Precise Measurement of Small Phase Delay[J].Applied Laser,1992(2). | |
| Authors: | Liu Tongpei Zhang Nai Engineering College Shanghai University Central Laboratory Shanghai Normal University |
| Abstract: | This paper reports a new method to measure small optical phase dclay. The methodhas the merits of high accuracy and simplicity of measuring system. It can be used to measureKerr coefficient of thin films such as PLZT and evaluate their electro-optic effect. |
| Keywords: | phase delay electro-optic effect PLZT thin film |
| 本文献已被 CNKI 等数据库收录！ | |