首页 | 本学科首页   官方微博 | 高级检索  
     

一种新的基于c/v的微电容的检测方法
引用本文:许立志,王明灼,曾黄麟.一种新的基于c/v的微电容的检测方法[J].数字技术与应用,2009(10):19-21.
作者姓名:许立志  王明灼  曾黄麟
作者单位:四川理工学院,四川自贡643000
基金项目:本文研究工作得到国家高技术研究发展计划(863计划)第四批课题,(2008AA11A134)基金的部分资助
摘    要:论文分析了传统及现有小电容检测方法存在的问题,基于C/V电容检测的基本原理,提出了一种新的基于C/V的微电容的检测方法,设计了一个简易的微电容运算放大器检测电路。根据电路模型分析和仿真测试结果表明,该电路具有抗杂敦电容干扰强、灵敏度高、容易实现无损在线检测、成本低等优点。

关 键 词:微电容  线性  检测电路  杂散电容

A New Approach of Micro-capacitor Measurment Based on Conver- sion of Capacitances and Voltages
Lizhi Xu Mingzhuo Wang Huanglin Zeng.A New Approach of Micro-capacitor Measurment Based on Conver- sion of Capacitances and Voltages[J].Digital Technology & Application,2009(10):19-21.
Authors:Lizhi Xu Mingzhuo Wang Huanglin Zeng
Affiliation:Lizhi Xu Mingzhuo Wang Huanglin Zeng ( Sichuan University of Science and Engineering, 643000, P. R. China )
Abstract:in this Paper, some of techniques for measuring of small capacitance are briefly discussed. A kind of simple operational amplifier circuit is designed on the basic principle of Conversion of Capacitances and Voltages (C / V) to detect the micro-capacitor. Based on analysis on capacitance detection of the circuit model and simulation test results given, It is shown that a circuit of micro-capacitor measurment based on C / V is of high sensitivity and low cost and easy for realization.
Keywords:micro-capacitance  Linear  detecting circuit  Stray capacitance
本文献已被 维普 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号