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最优阈值法检测晶振缺陷
引用本文:李兵,邓善熙,李焕然.最优阈值法检测晶振缺陷[J].电子质量,2003(8):J016-J017.
作者姓名:李兵  邓善熙  李焕然
作者单位:1. 合肥工业大学,仪器仪表学院,安徽,合肥,230009
2. 深圳翠涛电子科技有限公司,广东,深圳,518057
摘    要:为了对工业现场中晶振元件的缺陷进行检测,本文采用一种基于计算机图像处理的方法,由传统目测方法得到缺陷晶振的一般特征,然后对计算机采集到的图像按照缺陷分类,对每一种缺陷进行图像预处理和分析,在图像的分割中我们采用的是最优阈值统计算法,实验结果表明该算法能够达到预期的识别目的.

关 键 词:最优阈值  缺陷检测  计算机图像  缺陷晶振  图像分割  晶体振荡器

The Application of optimum threshold value in Crystal Oscillator's Defect Inspection
LI Bing,DENG Shan-xi,LI Huan-ran Hefei University of Technology,Anhui Hefei Shenzhen JuneTech Co.,Ltd Guangdong Shenzhen.The Application of optimum threshold value in Crystal Oscillator''''s Defect Inspection[J].Electronics Quality,2003(8):J016-J017.
Authors:LI Bing  DENG Shan-xi  LI Huan-ran Hefei University of Technology  Anhui Hefei Shenzhen JuneTech Co  Ltd Guangdong Shenzhen
Affiliation:LI Bing,DENG Shan-xi,LI Huan-ran Hefei University of Technology,Anhui Hefei 230009 Shenzhen JuneTech Co.,Ltd Guangdong Shenzhen 518057
Abstract:For inspecting the crystal oscillator s defects on industrial spot, this paper adopts a method based on computer image processing. We find out the common character of the defect parts by eyeballing first, and classify the image collected by computer according to the defect type, pre-processing and analysis the defected image last. The key in analysis is image segmentation; a method with optimum threshold value is introduced in this paper. The experiment indicates this algorithm can reach the anticipated results.
Keywords:defect inspection  optimum threshold value  image segmentation  crystal oscillator
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