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典型机箱的电磁屏蔽效能测试及电磁泄漏分析
引用本文:钟文彬,方伟.典型机箱的电磁屏蔽效能测试及电磁泄漏分析[J].电子质量,2010(9):67-69.
作者姓名:钟文彬  方伟
作者单位:中国西南电子技术研究所,四川成都,610036
摘    要:测试了机柜中常用的典型机箱的电磁屏蔽效能,得出了该种机箱在频率段30MHz-1CHz时水平极化和垂直极化方式下、有散热孔和无散热孔时的屏蔽效能值,综合分析了影响机箱电磁泄漏的主要因素,为机箱的设计及选用提供了依据。

关 键 词:机箱  屏蔽效能  电磁泄漏

Study on Electromagnetic Leakage and SE Test of the Typical Case
Zhong Wen-bin,Fang Wei.Study on Electromagnetic Leakage and SE Test of the Typical Case[J].Electronics Quality,2010(9):67-69.
Authors:Zhong Wen-bin  Fang Wei
Affiliation:(Southwest Institute of Electronic Technology,Sichuan Chengdu 610036)
Abstract:Electromagnetic shielding effectiveness of the typical case has been test.and the SE of Case was gained (frequency from 30MHz to 1 GHz,horizontal polarization and vertical polarization,with radiator holes and without radiator holes). Combining simulation results,the main causes of electromagnetic leakiness were founded.This research is useful to design or select oases in the future for engineers.
Keywords:Case  Shielding effectiveness  Eleetromagnatic Leakage
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