连退板浅表层的富集元素表征

为了研究连退板表层元素富集行为及相互作用,借助扫描电镜、辉光放电光谱仪、光电子能谱仪和透射电镜等技术手段对铝镇静钢和双相钢连退板表层中的富集元素进行了详细地表征与分析。结果表明,铝镇静钢连退板表面的主要富集元素有O、Mn和Al;而双相钢连退板表面的主要富集元素有O、Mn和Si。沿着浅表层深度分析可知,对于合金元素含量较高的双相钢,沿浅表层富集更深,富集深度约为50 nm;而合金元素含量较低的铝镇静钢,富集深度仅约为25 nm。综合分析不难发现,相对于铝镇静钢,双相钢添加了Si元素以后在其表面优先富集Si元素并同时形成了Si的氧化物,从而导致Al元素的富集及氧化物的形成受到了抑制。

Characterization of enriched element in the superficial layer of continuous annealing plate

In order to study the enrichment behavior and interaction of elements in the surface layer of continuous annealing plate, the enriched elements in the surface layer of aluminum killed steel and dual-phase steel continuous annealing plate were characterized and analyzed in detail by scanning electron microscopy, glow discharge optical emission spectrometry, photoelectron spectroscopy and transmission electron microscopy. The results showed that the main enriched elements on the surface of aluminum killed steel continuous annealing plate were O, Mn and Al, while the main enriched elements on the surface of dual-phase steel continuous annealing plate were O, Mn and Si. In-depth analysis along the superficial layer showed that for the dual-phase steel with higher alloying element content, the enrichment was deeper along the superficial layer with depth of about 50 nm. For the aluminum killed steel with relatively low content of alloying elements, the enrichment depth was only about 25 nm. The above analysis showed that, compared with the aluminum killed steel, Si element was preferentially enriched on its surface and oxides of Si was formed at the same time after the addition of Si element in dual-phase steel, leading to the inhibition in the enrichment of Al element and the formation of oxides.