Electrical characteristics of MOS capacitor using amorphous Gd2O3-doped HfO2 insulator |
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Authors: | JI Mei WANG Lei XIONG Yuhua DU Jun |
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Affiliation: | Advanced Electronic Materials Institute General Research Institute for Nonferrous Metals |
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Abstract: | This work described the electrical characteristics of a kind of amorphous Gd2O3-doped HfO2 insulator for high-k metal-oxide-semiconductor(MOS) capacitors.Compared with pure HfO2,the doped HfO2 with an optimum concentration of Gd2O3 as MOS gate dielectric exhibited a lower leakage current,thinner effective oxide thickness and less fixed oxide charges density.The result indicated that Gd2O3 doping power of 60 W exhibited the best electrical characteristics,maximum capacitance,lowest leakage current of 9.35079... |
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Keywords: | Gd2O3 high-k metal-oxide-semiconductor (MOS) rare earths |
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