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Electrical characteristics of MOS capacitor using amorphous Gd2O3-doped HfO2 insulator
Authors:JI Mei  WANG Lei  XIONG Yuhua  DU Jun
Affiliation:Advanced Electronic Materials Institute General Research Institute for Nonferrous Metals
Abstract:This work described the electrical characteristics of a kind of amorphous Gd2O3-doped HfO2 insulator for high-k metal-oxide-semiconductor(MOS) capacitors.Compared with pure HfO2,the doped HfO2 with an optimum concentration of Gd2O3 as MOS gate dielectric exhibited a lower leakage current,thinner effective oxide thickness and less fixed oxide charges density.The result indicated that Gd2O3 doping power of 60 W exhibited the best electrical characteristics,maximum capacitance,lowest leakage current of 9.35079...
Keywords:Gd2O3  high-k  metal-oxide-semiconductor (MOS)  rare earths
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