| Xray Diffraction Data and Rietveld Structure Refinement for CeNi_5Sn |
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| 引用本文： | 何维,曾令民,区向丽,吴自勤.Xray Diffraction Data and Rietveld Structure Refinement for CeNi_5Sn[J].中国稀土学报(英文版),1999(3). |
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| 作者姓名： | 何维 曾令民 区向丽 吴自勤 |
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| 作者单位： | He Wei(何 维) 1，3，Zeng Lingmin(曾令民) 2，Ou Xiangli(区向丽) 2，Wu Ziqin(吴自勤) 1 ( 1 Center for Fundamental Physics，University of Science and Technology of China，Hefei 230026; 2 Institute of Material Science，Guangxi University，Nanning 5300 |
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| 摘 要： | Ｒａｒｅｅａｒｔｈｓａｎｄｔｈｅｉｒｃｏｍｐｏｕｎｄｓｈａｖｅａｌｏｔｏｆｏｕｔｓｔａｎｄｉｎｇｐｒｏｐｅｒｔｉｅｓａｎｄａｒｅｐａｉｄｉｎｃｒｅａｓｉｎｇａｔｔｅｎｔｉｏｎｔｏ．ＮｕｍｅｒｏｕｓｉｎｖｅｓｔｉｇａｔｉｏｎｓｆｏｒｔｈｅｔｅｒｎａｒｙｓｙｓｔｅｍＲＥＮｉＳｎｈａｖｅｂｅｅｎｄｏｎｅ．ＴｈｅｃｒｙｓｔａｌｓｔｒｕｃｔｕｒｅｄｅｔｅｒｍｉｎａｔｉｏｎｏｆｔｈｅｃｏｍｐｏｕｎｄＣｅＮｉ５Ｓｎｂｙｒｅｃｉｐｒｏｃａｌｌａｔｔｉｃｅｐｈｏｔｏｇｒａｐｈｙｈａｓｂｅｅｎｒｅｐｏｒｔｅｄｗ…
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X ray Diffraction Data and Rietveld Structure Refinement for CeNi 5Sn |
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| He Wei.X ray Diffraction Data and Rietveld Structure Refinement for CeNi 5Sn[J].Journal of Rare Earths,1999(3). |
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| Authors: | He Wei |
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| Abstract: | |
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| Keywords: | Rare earths CeNi 5Sn X ray diffraction Rietveld structural refinement |
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