Dielectric properties of alumino-silicate ceramics synthesized by plasma sintering

The polycrystalline ceramic specimens of three different alumino-silicate solid solutions (Al_0.70Si_0.30O, Al_0.73Si_0.27O and Al_0.75Si_0.25O) consisting of different alumina and silica concentrations have been synthesized by thermal plasma sintering technique. From structural analysis carried out by X-ray diffraction, the ceramics are mostly found to consist of two different phases of mullite and sillimanite. SEM images of these ceramics reveal a high dense and less porous microstructure with homogeneous distribution of grains throughout their surface. These materials exhibit high dielectric constant value (>10³) with low dissipation factor. The AC conductivity analysis reveals that Al_0.70Si_0.30O and Al_0.75Si_0.25O ceramics possess room temperature conductivity values of the order of 10^?5, whereas Al_0.73Si_0.27O has conductivity of 10^?7 order that increases with rise in temperature. From the Nyquist plots, the grain and grain boundary conductivities are distinguished and negative temperature coefficient of resistance behavior is identified in these ceramics with small positive temperature coefficient of resistance effect.