Fabrication,structural and vibrational properties,and physical and optical properties tailoring of nanocrystalline MoS2 films |
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| Affiliation: | 1. College of Electrical and Information Engineering, Hunan University, Changsha, Hunan 410082, PR China;2. Department of Electrical Engineering, The City College of New York, 160 Convent Avenue, New York, NY 10031, USA;1. School of Microelectronics, Shandong University, Jinan, 250100, PR China;2. School of Physics, Shandong University, Jinan, 250100, PR China;1. Georgia Tech Lorraine, UMI 2958, Georgia Tech - CNRS, 57070 Metz, France;2. School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA;3. Centre de Nanosciences et de Nanotechnologies, Université Paris-Saclay, C2N – Site de Marcoussis, route de Nozay, F-91460 Marcoussis, France;1. Physical Science and Engineering Division, King Abdullah University of Science and Technology, Thuwal 23955‐6900, Saudi Arabia;2. Department of Materials & Engineering, Masdar Institute of Science and Technology-Khalifa University, Abu-Dhabi, United Arab Emirates;3. MINOS-EMaS, Universitat Rovira i Virgili, Tarragona, Spain;4. LPMC-EA2081, University of Picardie Jules Vernes, Amiens, France;1. Dept. of Physics, Sri Krishnadevaraya University, Anantapuramu, A.P., India-515003.;2. Dept. of Physics, Annamacharaya Institute of Tech. & Sciences, RajamPet, A.P., India-516126.;3. Inter-University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi, India-110067 |
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| Abstract: | The modification and tuning features of nanostructured films are of great interest because of controllable and distinctive inherent properties in these materials. Here, nanocrystalline MoS2 films were fabricated on the stainless steels by a radio frequency magnetron sputtering at ambient temperature. X-ray photoelectron spectroscopy, energy-dispersive X-ray spectroscopy, X-ray diffraction and Raman scattering spectroscopy were used to study the chemical state, chemical composition, crystal structure and vibrational properties of the fabricated MoS2 films. The bias voltage dependent structural evolution and its influence on the optical properties of MoS2 nanocrystalline films were systematically investigated. Besides, the residual stresses of MoS2 nanocrystalline films were explored by employing sin2ψ approach. X-ray diffraction demonstrates that the nanocrystalline MoS2 films have single-phase hexagonal crystal structure. All MoS2 films are polycrystalline in nature. The bandgap values are found to be intensively dependent on bias voltage. Our findings show that the nanocrystalline MoS2 films with different physical properties and intense quantum confinement effect can be realized through adjusting bias voltages. This work may provide deep insight for realizing transitional metal dichalcogenide-based nanostructured film optoelectronic devices with tunable physical properties through a traditional, very cost-effective, and large-scale fabrication method. |
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| Keywords: | Nanostructures Films Magnetron sputtering X-ray diffraction Physical properties |
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