首页 | 本学科首页   官方微博 | 高级检索  
     


Studying Fluid Characteristics Atop Surface Patterned Membranes via Particle Image Velocimetry
Authors:Didem Denizer  Ibrahim M A ElSherbiny  Mathias Ulbricht  Stefan Panglisch
Affiliation:1. University of Duisburg-Essen, Chair for Mechanical Process Engineering and Water Technology, Lotharstraße 1, 47057 Duisburg, Germany

University of Duisburg-Essen, Chair for Technical Chemistry II, Universitätsstraße 7, 45141 Essen, Germany;2. University of Duisburg-Essen, Chair for Mechanical Process Engineering and Water Technology, Lotharstraße 1, 47057 Duisburg, Germany;3. University of Duisburg-Essen, Chair for Technical Chemistry II, Universitätsstraße 7, 45141 Essen, Germany

Center for Water and Environmental Research (ZWU), Universitätsstraße 2, 45141 Essen, Germany

DGMT German Society of Membrane Technology, Geschäftsstelle ZWU, Universitätsstraße 2, 45141 Essen, Germany;4. University of Duisburg-Essen, Chair for Mechanical Process Engineering and Water Technology, Lotharstraße 1, 47057 Duisburg, Germany

Center for Water and Environmental Research (ZWU), Universitätsstraße 2, 45141 Essen, Germany

DGMT German Society of Membrane Technology, Geschäftsstelle ZWU, Universitätsstraße 2, 45141 Essen, Germany

IWW Water Center, Moritzstraße 26, 45476 Mülheim an der Ruhr, Germany

Abstract:Surface patterning is a recent promising approach to promote performance of pressure-driven membranes in water treatment and desalination. Nevertheless, knowledge about foulant deposition mechanisms, especially at early stage of filtration, is still lacking. The applicability of particle imaging velocimetry to study fluid characteristics atop surface patterned thin-film composite membranes was investigated at different operating conditions. This work is an important first step toward reliable understanding of the impacts of topographical membrane surface modification on hydrodynamic conditions and foulant deposition mechanisms.
Keywords:Fluid characteristics  Hydrodynamic drag  Membrane fouling  Particle imaging velocimetry  Surface patterning
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号