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MOS型场效应管的VHDL-AMS行为建模与仿真
引用本文:耿彦明,汪源,张健.MOS型场效应管的VHDL-AMS行为建模与仿真[J].北京电子科技学院学报,2007,15(2):49-51.
作者姓名:耿彦明  汪源  张健
作者单位:北京电子科技学院,北京,100070;北京电子科技学院,北京,100070;北京电子科技学院,北京,100070
摘    要:本文提出一种基于SPICE模型半导体器件的VHDL-AMS行为建模方法,给出了MOS场效应管模型中温度效应、噪声、直流和电容方程的行为模型,最后以CMOS反相器电路为例在混合信号仿真器SMASH5.72中验证了该行为模型的正确性。

关 键 词:MOS场效应管  Spice  VHDL-AMS  行为建模
文章编号:1672-464X(2007)02-0049-03
修稿时间:2007-05-18

Behavioral Modeling and Simulation of MOSFET based on VHDL-AMS
GENG Yan-ming,WANG Yuan,ZHANG Jian.Behavioral Modeling and Simulation of MOSFET based on VHDL-AMS[J].Journal of Beijing Electronic Science & Technology Institute,2007,15(2):49-51.
Authors:GENG Yan-ming  WANG Yuan  ZHANG Jian
Affiliation:Beijing Electronic Science and Technology Institute, Beijing 100070, China
Abstract:This paper presents a VHDL-AMS behavioral modeling method for the semiconductor devices based on Spice model,and the behavioral model of MOSFET is also provided,including models for temperature effects, noise, DC current and capacitance equations. Finally we take the CMOS inverter circuit as example and make use of the mixed signal simulator SMASH5.5 to verify the behavioral model.
Keywords:MOSFET  SPICE  VHDL-AMS  Behavioral Modeling
本文献已被 CNKI 维普 万方数据 等数据库收录!
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