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直板手机跌落破坏数字化分析研究
引用本文:彭必友,谢佳斌,冯权和,殷国富.直板手机跌落破坏数字化分析研究[J].西华大学学报(自然科学版),2009,28(1).
作者姓名:彭必友  谢佳斌  冯权和  殷国富
作者单位:1. 西华大学材料科学与工程学院,四川,成都,610039
2. 四川大学制造科学与工程学院,四川,成都,610065
基金项目:国家自然科学基金,校人才引进基金 
摘    要:自由跌落响应是电子产品环境试验的一个重要试验项目,多在产品开发后期进行。随着数字化技术的发展,可在产品设计阶段建立其有限元模型,通过模拟仿真分析得到产品各个零部件在跌落过程中的跌落响应和易产生缺陷的部位。本文结合某款直板手机,研究了跌落对手机外壳、屏幕等零部件的影响,并提出了改善措施。这对于更快捷地改善手机结构的合理性,减少整机物理样机实验次数,缩短产品研发周期有着重要的意义。

关 键 词:直板手机  跌落  数字化分析

Digitalized Analysis of Open-faced Mobile Phone Damage Caused by Falling
PENG Bi-you,XIE Jia-bin,FENG Quan-he,YIN Guo-fu.Digitalized Analysis of Open-faced Mobile Phone Damage Caused by Falling[J].Journal of Xihua University:Natural Science Edition,2009,28(1).
Authors:PENG Bi-you  XIE Jia-bin  FENG Quan-he  YIN Guo-fu
Abstract:Free-drop response is a main item of environmental examinations for electronic products.The examination is always performed in the anaphase of a product development.With the development of digital technology,finite element model can be set up in the design phase of a product.Through simulation analysis of a product,the falling response for the components of the product and the locations where damages occur in the course of falling can be obtained.In this paper,an open-faced mobile phone is used to study the influence of falling on the damage of phone's parts such as shell,screen and so on.The relevant improvement measures are proposed.The study is of benefit for the improvement of the phone structure,reducing the number of prototype physical experiments and shortening product development cycle.
Keywords:open-faced mobile phone  falling  digitalized analysis
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