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基于FPGA中FIFO误码率软硬件测试方法
引用本文:王科,刘振安,赵棣新,过雅南,徐昊,阴泽杰.基于FPGA中FIFO误码率软硬件测试方法[J].电子测量技术,2004(2):5-6.
作者姓名:王科  刘振安  赵棣新  过雅南  徐昊  阴泽杰
作者单位:中国科学技术大学;中国科学院高能物理研究所
摘    要:文中介绍用FPGA中FIFO的误码率软件和硬件测试方法,简介数据比较程序;说明硬件测试中伪随机码序列特点和生成原理,并对比较时如何使数据对应做出讨论.最后列出测试结果,比较这两种方法的优缺点.

关 键 词:误码率  先进先出寄存器  伪随机码  线性反馈移位寄存器

BER Testing by Software and Hardware based on FIFOs in FPGA
Wang Ke Liu Zhenan Zhao Dixin Guo Yanan Xu Hao Yin Zejie.BER Testing by Software and Hardware based on FIFOs in FPGA[J].Electronic Measurement Technology,2004(2):5-6.
Authors:Wang Ke Liu Zhenan Zhao Dixin Guo Yanan Xu Hao Yin Zejie
Affiliation:Wang Ke Liu Zhenan Zhao Dixin Guo Yanan Xu Hao Yin Zejie
Abstract:In this paper, Bit Error Rate Testing by software and Hardware based on FIFOs in FPGA is introduced. The comparing program in VB, how to produce a pseudorandom bit stream, and how to make the compared synchronous data correspondingly is described. At last, results of the software and hardware testing are given and compared.
Keywords:Bit Error Rate FIFO pseudorandom bit stream linear feedback shift register  
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