| 基于平均频谱测试高速ADC动态参数的方法 |
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| 引用本文： | 何芹,;黄朴,;虞致国,;魏敬和,;顾晓峰.基于平均频谱测试高速ADC动态参数的方法[J].电子测量与仪器学报,2014(7):755-762. |
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| 作者姓名： | 何芹 ;黄朴 ;虞致国 ;魏敬和 ;顾晓峰 |
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| 作者单位： | [1]轻工过程先进控制教育部重点实验室江南大学电子工程系,无锡214122; [2]中国电子科技集团公司第58研究所,无锡214035 |
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| 基金项目： | 江苏省自然科学基金（BK20130156）、中央高校基本科研业务费专项资金（JUSRP1026）、江苏高校优势学科建设工程（PAPD）、江苏省科技厅产学研联合创新资金（BY2013015-19）、江苏省六大人才高峰（DZXX-027）、2014年江苏省研究生创新工程项目（SJZZ_0148）资助项目 |
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| 摘 要： | 利用快速傅里叶变换进行模数转换器(ADC)动态参数测试很难做到相干采样和整周期截断,因此非相干采样存在必然性,由此造成的频谱泄漏将影响动态参数的测量结果。针对此问题,提出了一种基于平均频谱测试高速ADC动态参数的方法。基于MATLAB构建了验证平台,采用美国模拟器件公司(ADI)的典型高速ADC产品的行为级动态模型进行了仿真验证。仿真结果表明,在非相干程度最大的情况下,基于不同窗函数的平均频谱测试得到的动态参数误差低于1.67%,且达到了IEEE Std 1241-2000的测试标准,降低了测试系统构建难度和成本。
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| 关 键 词： | 模数转换器 动态参数测试 非相干采样 平均频谱 频谱泄漏 |
The method for testing dynamic parameters of high-speed ADCs based on average spectrum |
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| Affiliation: | He Qin, Huang Pu, Yu Zhiguo, Wei Jinghe, Gu Xiaofeng ( 1. Key Laboratory of Advanced Process Control for Light Industry ( Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi 214122, China; 2. CETC58, Wuxi 214035, China) |
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| Abstract: | The test for dynamic parameters of analog-to-digital converters （ ADCs） by the fast Fourier transformation has difficulties in performing coherent sampling and integral period truncation .Therefore, the incoherent sampling is inevitable, and the dynamic parameter measurement result will be disturbed by the spectral leakage .To solve this problem, a method based on the average spectrum is proposed to test dynamic parameters of high-speed ADCs. The verification platform is constructed based on MATLAB .The behaviorlevel dynamic models of typical high-speed ADCs produced by Analog Devices Incorporation （ ADI） are employed for simulation and verification.The simulation results show that, in the case of the largest incoherence degree, the errors of dynamic parameter measurement results are smaller than 1.67% based on the average spectrum method with different window functions , and the test standards provided by IEEE Std.1241-2010 can be reached, and the difficulties and cost in constructing the evaluation system can be reduced . |
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| Keywords: | analog-to-digital converter dynamic parameter test incoherent sampling average spectrum spectral leakage |
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