| 杂背景下TFT-LCD表面缺陷检测系统的设计 |
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| 引用本文： | 朱光,朱学芳,张华坤.杂背景下TFT-LCD表面缺陷检测系统的设计[J].电子测量与仪器学报,2011(12):1054-1059. |
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| 作者姓名： | 朱光 朱学芳 张华坤 |
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| 作者单位： | [1]南京大学信息管理系多媒体信息处理研究所,南京210093 [2]合肥工业大学仪器科学与光电工程学院,合肥230009 |
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| 摘 要： | 设计了背景去除算法和缺陷区域检测算法,对复杂背景与低对比度条件下采集的TFT-LCD图像进行处理,利用一维傅里叶变换和全尺寸小波变换提取缺陷特征信息,可以较准确地检测出缺陷区域.搭建了在线检测系统平台,通过辅助光源和高速线阵相机采集图像,由图像采集卡保存至计算机中,利用Matlab编写上层图像处理软件进行在线检测.实验...
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| 关 键 词： | TFT-LCD 缺陷检测 一维傅里叶变换 全尺寸小波变换 |
Design of inspection system for TFT-LCD surface defects under complex background |
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| Zhu Guang Zhu Xuefang Zhang Huakun.Design of inspection system for TFT-LCD surface defects under complex background[J].Journal of Electronic Measurement and Instrument,2011(12):1054-1059. |
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| Authors: | Zhu Guang Zhu Xuefang Zhang Huakun |
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| Affiliation: | Zhu Guang Zhu Xuefang Zhang Huakun(1.Department of Information Management,Institute of Multimedia Information Processing,Nanjing University,Nanjing 210093,China;2.The School of Instrument Science and Opt-electronic Engineering,Hefei University of Technology,Hefei 230009,China) |
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| Abstract: | Background removal and flaw region detect algorithm are designed for processing the TFT-LCD images under the condition of complex background and low contrast.In this paper,one-dimensional Fourier transform and full-size characteristics of wavelet transform to extract the flaw information are used to detect the flaw region accurately.The online detect platform is built to capture the images with help of illuminants and high-speed line-scan camera,then the images are saved in computer by image acquisition card.The image-processing software is coded by Matlab.The experiment analysis for the test result under different illuminant condition shows that the system can accurately detect the flaw region of TFT-LCD panel surface.The identification rate is greater than 96% and the scanning time interval is less than 80μs which meets the requirements of real-time. |
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| Keywords: | TFT-LCD flaw detect one-dimensional Fourier transform full-size wavelet transform |
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