| 基于特征分析的ROM及RAM故障诊断算法 |
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| 引用本文： | 章亦葵,张耀升.基于特征分析的ROM及RAM故障诊断算法[J].电子测量与仪器学报,1995,9(2):26-31. |
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| 作者姓名： | 章亦葵 张耀升 |
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| 作者单位： | 天津大学自动化系!天津300072 |
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| 摘 要： | 本文提出基于特征分析法的ＲＯＭ加权及ＲＡＭ两次求反加权故障诊断算法。该算法可植入被测系统控制软件之中，完成ＲＯＭ及ＲＡＭ的实时故障自诊断。
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| 关 键 词： | 特征分析 故障诊断 ROM RAM |
Fault Diagnosis Algorithms for ROM and RAM Based on Signature Analysis |
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| Zhang Yikui, Zhang Yaosheng.Fault Diagnosis Algorithms for ROM and RAM Based on Signature Analysis[J].Journal of Electronic Measurement and Instrument,1995,9(2):26-31. |
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| Authors: | Zhang Yikui Zhang Yaosheng |
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| Abstract: | Two algorithms based on signature analysis for testing ROM and RAM are proposed in this paper. That is, Weighted Sum of ROM fault diagnosis, and two-time ReversedWeighted Sum of RAM fault diagnosis. These algorithms can be embeded in the software ofunder testing system,to complete self-test on ROM and RAM. |
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| Keywords: | Signature analysis Fault diagnosis |
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