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用VHDL实现虚拟数字集成电路的故障检测
引用本文:宋跃,谭爱群,李哲明,李寿存.用VHDL实现虚拟数字集成电路的故障检测[J].电测与仪表,2001,38(9):15-18,31.
作者姓名:宋跃  谭爱群  李哲明  李寿存
作者单位:湖南湘潭师范学院物理与信息工程系
摘    要:介绍以AlteraCPLD系列FLEX10K器件为虚拟载体,在Windows95/98下借助Delphi5.0实现人机交互界面,借助PC机的控制离线完成对常用TTL74和54系列、CMOS4000和4500系列、常用RAM、EPROM、部分CPU接口芯征的故障检测的VHDL设计原理和实现方法。

关 键 词:虚拟仪器  人机交互界面  引脚智能选控  测试数据库  智能测试  数字集成电路  VHDL
文章编号:1001-1390(2001)09-0015-04

The study and realization on virtual testing digital IC chips in VHDL
Song Yue,Tan Aiqun,Li Zheming,Li Shoucun.The study and realization on virtual testing digital IC chips in VHDL[J].Electrical Measurement & Instrumentation,2001,38(9):15-18,31.
Authors:Song Yue  Tan Aiqun  Li Zheming  Li Shoucun
Abstract:In this paper,we introduce a testing instrument,which used the Altera CPLD FLEX10K device as the virtual carrier controlled by PC.By means of Delphi 5.0in Win-dows95/98,we can qualitatively test the malfunction of many kinds of chips away from the system such as the series of TTL74and TTL54,CMOS4000and CMOS4500,RAM,E-PROM,the some interface chips of CPU etc.The instruments' VHDL design principle and realizing method are also given.
Keywords:virtual instrument  man-computer interface  pins selected and controlled automati-cally  testing data base  testing automatically
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