| 某LED开关电源的高加速寿命试验(HALT)研究 |
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| 引用本文： | 叶雪荣,刘高锋,孙博,刘明伟,王一行,翟国富.某LED开关电源的高加速寿命试验(HALT)研究[J].电测与仪表,2016,53(2):10-14. |
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| 作者姓名： | 叶雪荣 刘高锋 孙博 刘明伟 王一行 翟国富 |
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| 作者单位： | 1. 哈尔滨工业大学电气工程及自动化学院,哈尔滨,150001;2. 上海海关学院,上海,201204 |
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| 摘 要： | LED作为新兴固态照明系统,其驱动电源的可靠性也引起了广泛的关注。高加速寿命试验作为可靠性强化试验,可以在较短时间内激发电子系统的故障模式。文中以某LED驱动用开关电源为对象,对其高加速寿命试验进行了研究。首先分析了该电源的基本结构与工作原理,确定其失效判据。设计了随机振动步进应力试验方案,得到该电子系统的可靠性薄弱环节,为其可靠性设计提供依据。
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| 关 键 词： | LED开关电源 高加速寿命试验 失效判据 全轴随机振动 |
| 收稿时间： | 2014/12/21 0:00:00 |
| 修稿时间： | 2014/12/21 0:00:00 |
Highly Accelerated Life Test (HALT) Research on a LED Switching Power Supply |
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| YE Xue-rong,LIU Gao-feng,SUN Bo,liumingwei,WANG Yi-xing and ZHAI Guo-fu.Highly Accelerated Life Test (HALT) Research on a LED Switching Power Supply[J].Electrical Measurement & Instrumentation,2016,53(2):10-14. |
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| Authors: | YE Xue-rong LIU Gao-feng SUN Bo liumingwei WANG Yi-xing and ZHAI Guo-fu |
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| Affiliation: | School of electrical engineering and automation,Harbin Institute of Technology,School of electrical engineering and automation,Harbin Institute of Technology,School of electrical engineering and automation,Harbin Institute of Technology,Shanghai Customs College,School of electrical engineering and automation,Harbin Institute of Technology,School of electrical engineering and automation,Harbin Institute of Technology |
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| Abstract: | LED is a novel solid state lighting system, the reliability of whose driving power supply has attracted a wide attraction. As the reliability enhancement test, highly accelerated life test can excited the failure modes of the electronic system in a short period. This paper proposed a high accelerated life test with the LED switching power supply. Firstly, it analysed the basic structure and principle of the switching power supply. Then it determined the failure criterion. The paper also designed the random vibration step stress test plan and found the weak link reliability of the electronic system, which provided the basis for the reliability design. |
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| Keywords: | LED switching power supply high accelerated life test failure criterion omni axes random vibration |
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