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一种变游程编码的测试数据压缩方法
引用本文:王增辉,雷加.一种变游程编码的测试数据压缩方法[J].国外电子测量技术,2009,28(5):38-41.
作者姓名:王增辉  雷加
作者单位:桂林电子科技大学电子工程学院,桂林,541004
摘    要:随着集成电路制造工艺水平的提升和芯片面积的增加,测试需要越来越多的测试数据。测试压缩能够有效地减少测试数据量,降低测试数据存储容量和测试设备数据传输通道的要求,减少测试时间,降低测试成本。提出了一种有效的测试数据压缩编码,称之为AFDR码。该码直接对测试序列中连续的0、连续的1以及交替变化位的长度进行编码,对测试序列没有要求,更加直接有效。实验结果显示,这种编码能够有效地压缩测试数据。

关 键 词:压缩/解压  FDR码  AFDR码

Variant of run-length coding of test data compression method
Wang Zenghui,Lei Jia.Variant of run-length coding of test data compression method[J].Foreign Electronic Measurement Technology,2009,28(5):38-41.
Authors:Wang Zenghui  Lei Jia
Affiliation:(College of Electronic Engineering, Guilin University of Electronic and Technology, Guilin 541004, China)
Abstract:With the level of integrated circuit manufacturing process improving and increasing in chip area, test requires more and more test data. Compression test can effectively reduce test data volume; reduce test data storage capacity and data transmission channel test equipment requirements; and reduce test time, lower cost of test. This paper proposes an efficient test data compression coding, called AFDR code. The code can directly test sequence in successive 0, a continuous one, as well as alternating changes in the length of bit encode, and the test sequence does not require more direct and effective. Test results show that the coding can effectively compress the test data.
Keywords:compression/decompression  FDR code  AFDR code
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