|
|||||
|
|
| 基于微程序设计的内建自测试技术研究 | |
| 引用本文： | 郑文荣,刘少伟,王树宗.基于微程序设计的内建自测试技术研究[J].国外电子测量技术,2011,30(5):20-22,44. |
| 作者姓名： | 郑文荣 刘少伟 王树宗 |
| 作者单位： | 1. 92941部队94分队,葫芦岛,125001;海军工程大学兵器工程系,武汉,430033 2. 92941部队94分队,葫芦岛,125001 3. 海军工程大学兵器工程系,武汉,430033 |
| 摘 要： | 介绍了一种基于微程序构建的控制系统内建自测试体系,设计中运用了3种不同类型的微指令,将性线移位寄存器作为响应分析器,用于电路响应信号压缩;对自测试体系在测试诊断过程中各微程序执行的工作流程和诊断原理进行详细分析.基于微程序设计的控制系统诊断体系具有较高的故障诊断和检测效果,可精确定位系统中板级电路故障. |
| 关 键 词： | 微程序 微指令 内建自测试 线性反馈移位寄存器 混淆概率 |
Study on built-in self test technology based on the microprogramming |
|
| Zheng Wenrong,Liu Shaowei,Wang Shuzong.Study on built-in self test technology based on the microprogramming[J].Foreign Electronic Measurement Technology,2011,30(5):20-22,44. | |
| Authors: | Zheng Wenrong Liu Shaowei Wang Shuzong |
| Affiliation: | 1.Unit 94 of 92941,PLA,Huludao 125001,China;2.Dept.of Weaponry Eng.,Naval Univ.of Engineering,Wuhan 430033,China) |
| Abstract: | A design of built-in self test（BIST） in one control system based on the microprogramming is introduced.There are three kinds of micro instructions in the BIST system,and the linear feedback shift register（LFSR） is used as response signature analyzer is the BIST to compress the circuit＇s signature.The flow graph of the running of microprogramming and principle of the BIST architecture in diagnose process is proposed.The design of BIST based on microprogramming has excellent capabilities to diagnosis and detect the fault,which can locate the fault of circuit on board accurately. |
| Keywords: | microprogramming micro instruction built-in self test linear feedback shift register aliasing error probability |
| 本文献已被 维普 万方数据 等数据库收录！ | |