| 8051单片机系统的自检容错设计 |
| |
| 引用本文： | 陈卫兵.8051单片机系统的自检容错设计[J].国外电子测量技术,2005,24(3):15-16. |
| |
| 作者姓名： | 陈卫兵 |
| |
| 作者单位： | 阜阳师范学院物理系,阜阳,236032 |
| |
| 摘 要： | 从单片机应用系统的可靠性的角度出发，利用8051单片机的存储体系结构的特点，给出了一种简单的自检容错设计方法。
|
| 关 键 词： | 单片机 可靠性 自检 |
Fault-tolerant Design of Self-check for 8051 Single Chip System |
| |
| Chen Weibing.Fault-tolerant Design of Self-check for 8051 Single Chip System[J].Foreign Electronic Measurement Technology,2005,24(3):15-16. |
| |
| Authors: | Chen Weibing |
| |
| Abstract: | With respect of reliability of the single chip processor application system ,this paper introduces a fault-tolerant design method of self-check by way of the characteristic of the 8051 memory architecture. |
| |
| Keywords: | Single chip processor reliability self-check |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
