| 可互换仪器驱动器模型研究 |
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| 引用本文： | 叶海明,周绍磊.可互换仪器驱动器模型研究[J].国外电子测量技术,2008,27(12). |
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| 作者姓名： | 叶海明 周绍磊 |
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| 作者单位： | 海军航空工程学院,烟台,264000 |
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| 摘 要： | 针对自动测试系统中存在的测试程序可互换性差、可移植性不强的问题,提出了一种新的仪器驱动器设计模型,采用IVI面向信号(IVI-SD)模型,同时利用COM技术对模型进行扩展。该模型实现了测试程序在仪器更换后不必重新编写,改善了自动测试软件的通用性、互换性,为解决自动测试系统的软件可移植性问题提供了一种新的思路。
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| 关 键 词： | IVI-SD 自动测试系统 仪器驱动器 |
Research on the interchangeable instrument driver |
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| Ye Haiming,Zhou Shaolei.Research on the interchangeable instrument driver[J].Foreign Electronic Measurement Technology,2008,27(12). |
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| Authors: | Ye Haiming Zhou Shaolei |
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| Abstract: | For improving the interchangeability of ATE,a new instrument driver model is designed based on IVI-SD model and IVI-COM model.The soft-platform's extensibility is improved for it is not necessary to rewrite the test pro- gram when the instruments changed.The instrument driver model meets the needs of generality and interchangeability of automatic test equipment software. |
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| Keywords: | IVI-SD ATE driver |
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