| 基于可配置的2-DLFSR结构优化设计 |
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| 引用本文： | 何艳梅,雷加.基于可配置的2-DLFSR结构优化设计[J].国外电子测量技术,2010,29(5):63-66. |
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| 作者姓名： | 何艳梅 雷加 |
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| 作者单位： | 桂林电子科技大学CAT研究室,桂林,541004 |
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| 摘 要： | 线性移位寄存器由于具有较好的随机性而用于测试矢量生成，但是一维线性移位寄存器不能生成确定性向量。基于可配置的二维线性移位寄存器（2-DLFSR）矢量生成器，无需存储测试矢量，能生成期望的测试矢量。针对可配置的2-DLF—SR结构，提出了基于矩阵优化设计方法。首先，将期望的测试集划分为互不相容的相容输入集，再通过搜索最大相关项以确定可配置2-DLFSR的结构。经实例验证，该设计方案简单可行，硬件开销进一步减少。
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| 关 键 词： | 内建自测试 二维线性移位寄存器 测试矢量生成 |
New approach to optimize a configurable 2-D LFSR for BIST |
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| He Yanmei,Lei Jia.New approach to optimize a configurable 2-D LFSR for BIST[J].Foreign Electronic Measurement Technology,2010,29(5):63-66. |
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| Authors: | He Yanmei Lei Jia |
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| Affiliation: | He Yanmei Lei Jia (Computer Aided Testing Laboratory, Guilin University of Electronic Technology, Guilin 541004, China) |
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| Abstract: | LFSRs are commonly used as test-pattern generators because the generated sequence of test patterns has good randomness properties. However, a conventional LFSR cannot produce a sequence of deterministic ordered vectors. A configurable two-dimensional （2-D） linear feedback shifter register （LFSR） based test pattern generator can generate a sequence of pre-computed test patterns without storage of test patterns. This paper presents a novel approach to optimize the structure design of 2-D LFSRs. Firstly,partition these pre-computed test patterns into disjoint subsequence and then search the maximum-related item in each partitioned subsequence in order to optimize and design the 2-D LFSRs structure. Result show that hardware reduction is achieved. |
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| Keywords: | BIST 2-D LFSR test-pattern generation |
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