| 基于二叉树满足MC/DC测试用例设计方法 |
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| 引用本文： | 张宇,张波,王俊杰,陈媛.基于二叉树满足MC/DC测试用例设计方法[J].微计算机信息,2010(3). |
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| 作者姓名： | 张宇 张波 王俊杰 陈媛 |
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| 作者单位： | 同济大学;中国科学院长春光学精密机械与物理研究所; |
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| 摘 要： | 软件测试是保证软件质量的有效方法,但测试工作过程繁琐,工作量较多。探索高效、可靠的测试用例设计方法一直是大家追求的目标,随着航空航天产品逻辑复杂性的提高及软件规模的日益增大,这种要求也变得更加迫切。依据MC/DC设计的测试用例既提高了测试用例设计的效率又增加了测试覆盖率,比较适合测试逻辑关系相对复杂的软件。当前的很多软件测试工具提供了软件测试覆盖率的判定功能,可以评定设计出的测试用例是否满足MC/DC的要求,而软件测试人员需要的是逆向的过程,论文提出应用唯一原因法和屏蔽法原理设计测试用例,可达到根据逻辑关系自动生成满足MC/DC要求测试用例的目的,提高了测试用例设计的效率。
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| 关 键 词： | 软件测试 MC/DC 二叉树 唯一原因法 屏蔽法 |
Fit MC/DC for test case generation method based on binary tree |
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| ZHANG Yu ZHANG Bo WANG Jun-jie CHEN Yuan.Fit MC/DC for test case generation method based on binary tree[J].Control & Automation,2010(3). |
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| Authors: | ZHANG Yu ZHANG Bo WANG Jun-jie CHEN Yuan |
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| Affiliation: | ZHANG Yu ZHANG Bo WANG Jun-jie CHEN Yuan(Tong Ji University,Shang-hai,200092,China) (Changchun Institute of Optics,Fine Mechanics , Physics,the Chinese Academy of Sciences,Chang-chun 130033,China) |
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| Abstract: | Software testing is an effective way to ensure software quality,but the process of testing is tedious and workload more. To explore efficient and reliable test case design approach is our goal has always been. As the logic complexity of aerospace products and the size of its software increased gradually. It need to improve the efficiency of test case design. Based on MC/DC the test cases is designed,it is not only improve the efficiency of test case design but also added to the test coverage. All that are m... |
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| Keywords: | software testing MC/DC binary tree unique cause masking |
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