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电容层析成像系统传感器参数优化——基于正交试验设计法
引用本文:高岩,李谋遵,周昌乐.电容层析成像系统传感器参数优化——基于正交试验设计法[J].计算机工程与应用,2007,43(8):225-229.
作者姓名:高岩  李谋遵  周昌乐
作者单位:1. 厦门大学,计算机系,福建,厦门,361005
2. 夏新移动通讯有限公司,福建,厦门,361022
基金项目:厦门大学校科研和校改项目
摘    要:介绍了电容层析成像系统的工作原理及数学模型,采用有限元分析对传感器灵敏度分布进行仿真,分析了系统中各个传感器参数对传感器性能的影响,提出传感器性能评价函数,并基于正交试验设计确定了一组优化参数,为电容层析成像系统中传感器的设计提供了参考依据。

关 键 词:电容层析成像  灵敏度分布  有限元分析  正交试验设计
文章编号:1002-8331(2007)08-0225-05
修稿时间:2006-12

Parameter optimization based on orthogonal test design for transducer in Electrical Capacitance Tomography system
GAO Yan,LI Mou-zun,ZHOU Chang-le.Parameter optimization based on orthogonal test design for transducer in Electrical Capacitance Tomography system[J].Computer Engineering and Applications,2007,43(8):225-229.
Authors:GAO Yan  LI Mou-zun  ZHOU Chang-le
Affiliation:1.Department of Computer Science,Xiamen University,Xiamen,Fujian 361005,China; 2.Amoi Mobile Communication Co.,Ltd.,Xiamen,Fujian 361022,China
Abstract:The work principle and mathematical model of Electrical Capacitance Tomography(ECT) is introduced.The simulation based on Finite Element Aanalysis(FEA) about the sensitivity distribution of capacitance transducers is accomplished and the influence that the parameters of transducers impose on the performance of ECT is studied.The optimum structural parameters of transducer are achieved to improve the performance of transducer based on the given optimum function through orthogonal test design,which offers reference for the design of capacitance transducers.
Keywords:Electrical Capacitance Tomography(ECT)  sensitivity distribution  Finite Element Analysis(FEA)  orthogonal test design
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