| 全速电流测试的故障精简和测试生成 |
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| 引用本文： | 牛小燕,闵应骅,邝继顺.全速电流测试的故障精简和测试生成[J].计算机辅助设计与图形学学报,2004,16(10):1442-1447,1453. |
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| 作者姓名： | 牛小燕 闵应骅 邝继顺 |
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| 作者单位： | 1. 湖南大学计算机与通信学院,长沙,410082
2. 湖南大学计算机与通信学院,长沙,410082;中国科学院计算技术研究所信息网络研究室,北京,100080 |
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| 基金项目： | 国家自然科学基金 (90 2 0 70 0 2 ,60 173 0 42 )资助 |
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| 摘 要： | 针对全速电流测试方法测试生成算法效率低下的问题，提出故障压缩、故障模拟等故障精简的方法，以提高该方法的测试生成效率．实验结果表明，该方法使得需要进行测试生成的故障点平均减少了66．8％，该测试方法的测试生成的效率提高了200多倍．
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| 关 键 词： | 全速电流测试 故障压缩 测试生成 开路故障 |
Fault Collapsing and Test Generation for At-speed Current Testing |
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| Niu Xiaoyan Min Yinghua , Kuang Jishun.Fault Collapsing and Test Generation for At-speed Current Testing[J].Journal of Computer-Aided Design & Computer Graphics,2004,16(10):1442-1447,1453. |
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| Authors: | Niu Xiaoyan Min Yinghua Kuang Jishun |
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| Affiliation: | Niu Xiaoyan 1) Min Yinghua 1,2) Kuang Jishun 1) 1) |
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| Abstract: | Though the dynamic current testing can cover more faults than I DDQ , it requires a very high speed automatic test equipment (ATE) or a high quality sensor for on-line testing, which is not available at present The method of at-speed current testing applies two alternative vectors to the circuits under test to enable the possibility for using a slow measurement and testing-at a high frequency operation This paper proposes some techniques for fault collapsing for stuck-open faults, and their application to test generation for at-speed current testing Experimental results show that the test generation efficiency is improved by 200 times through employment of the fault collapsing techniques |
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| Keywords: | at-speed current testing fault compression test generation stuck-open faults |
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