Data Mining using Genetic Programming for Construction of a Semiconductor Manufacturing Yield Rate Prediction System |
| |
Authors: | Te-Sheng Li Cheng-Lung Huang Zong-Yuan Wu |
| |
Affiliation: | (1) Department of Industrial Engineering and Management, Ming Hsin University of Science and Technology, Hsinchu, Taiwan, ROC;(2) Department of Information Management, National Kaohsiung First University of Science and Technology, 2, Juoyue Rd., Nantz District, Kaohsiung 811, Taiwan, ROC;(3) Department of Information Management, Huafan University, Taipei, Taiwan, ROC |
| |
Abstract: | The complexity of semiconductor manufacturing is increasing due to the smaller feature sizes, greater number of layers, and existing process reentry characteristics. As a result, it is difficult to manage and clarify responsibility for low yields in specific products. This paper presents a comprehensive data mining method for predicting and classifying the product yields in semiconductor manufacturing processes. A genetic programming (GP) approach, capable of constructing a yield prediction system and performing automatic discovery of the significant factors that might cause low yield, is presented. Comparison with the results then is performed using a decision tree induction algorithm. Moreover, this research illustrates the robustness and effectiveness of this method using a well-known DRAM fab’s real data set, with discussion of the results. Received: November 2004 / Accepted: September 2005 |
| |
Keywords: | Data mining Genetic programming Feature selection Yield prediction Semiconductor manufacturing |
本文献已被 SpringerLink 等数据库收录! |
|