基于内建自测试的测试向量生成方法

内建自测试(BIST)方法是目前可测性设计(DFT)中最具应用前景的一种方法。BIST能显著提高电路的可测性,而测试向量的生成是关系BIST性能好坏的重要方面。测试生成的目的在于,生成可能少的测试向量并用以获得足够高的故障覆盖率,同时使得用于测试的硬件电路面积开销尽可能低,测试时间尽可能短。本文对几种内建自测试中测试向量生成方法进行了简单的介绍和对比研究,分析各自的优缺点,并在此基础上探讨了BIST面临的主要问题和发展方向。

Test Vector Generation Methods Based on BIST

BIST is the most promising method in DFT. BIST can significantly improve the testability of the circuits, and test vec-tor generation is one of the most important parts of BIST. The focus of test vector generation is how to generate new vectors as few as possible that can achieve fault coverage sufficiently while test circuits area overhead and the testing time should be as little as pos-sible. In this paper, many methods for test vector generation are analyzed and contrasted. In the end, we discuss issues to be resolved and its development direction.