寄存器软错误对程序可靠性影响的静态分析

继性能和功耗问题之后，软错误导致的计算可信性已成为一个日益严峻的课题。其中，由于寄存器访问频繁却未能被良好保护，发生在其中的软错误成为影响程序可靠性的关键因素之一。基于程序汇编代码，提出一种针对寄存器软错误的程序可靠性静态分析方法。首先通过数据流分析技术提取所有可能影响程序执行的寄存器活跃区间，然后基于活跃区间的路径表达式分析其执行时间和出现频率，最后在此基础上计算在寄存器软错误影响下的程序可靠性。实验表明，该方法的分析结果与AVF分析法保持一致，同时其结果还指出相关的寄存器活跃区间的执行时间和出现频率，这为实现针对寄存器软错误的高效容错方法提供了依据。

Static Analysis of Soft Errors Effect in Register Files for Program Reliability

Subsequently to the wall of performance and power consumption, the dependability of computing caused by soft errors has become a growing concern. Since register files are accessed very frequently and can not be well protected,soft errors occurring in them arc one of the top reasons for affecting the reliability of program.To access the effect of soft errors in register files, a static analysis approach for program reliability was presented based on the assembly codes. Firstly, all possible live interval of registers, which may degrade the program reliability, were sketched through the data flow analysis techniques; then the execution time and frequency of each live interval were analyzed according to the expression of execution path;finally the program reliability can be calculated under the occurrence of soft errors in register files. Experiments show that the analytical results arc compatible with the AVF methods'. Moreover, the execution time and frequency of all involved interval have been presented, which arc in favor of implementing the high effitient fault tolerance methods for soft errors in register files.