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使用双重种子压缩的混合模式自测试
引用本文:梁华国,蒋翠云.使用双重种子压缩的混合模式自测试[J].计算机研究与发展,2004,41(1):214-220.
作者姓名:梁华国  蒋翠云
作者单位:1. 合肥工业大学计算机与信息学院,合肥,230009
2. 合肥工业大学信息与计算科学系,合肥,230009
基金项目:德国国家基金项目 (Wu2 45 /2 4)
摘    要:提出了一种基于扫描混合模式的内建自测试的新颖结构,为了减少确定测试模式的存储需求,它依赖一个双重种子压缩方案,采用编码折叠计数器种子作为一个LFSR种子,压缩确定测试立方体的个数以及它的宽度.这种建议的内建自测试结构是完全相容于标准的扫描设计,简单而具有柔性,并且多个逻辑芯核可以共享.实验结果表明,这种建议的方案比先前所公布方法需要更少的测试数据存储,并且具有相同的柔性和扫描相容性。

关 键 词:内建自测试  确定的内建自测试  存储与生成方案  测试数据压缩

Mixed Mode BIST Using Bi-Seed Compression
LIANG Hua-Guo,and JIANG Cui-Yun.Mixed Mode BIST Using Bi-Seed Compression[J].Journal of Computer Research and Development,2004,41(1):214-220.
Authors:LIANG Hua-Guo  and JIANG Cui-Yun
Affiliation:LIANG Hua-Guo 1 and JIANG Cui-Yun 2 1
Abstract:A novel architecture for scan-based mixed mode BIST is presented in this paper. To reduce the storage requirements for the deterministic patterns, it relies on a bi-seed compression. To reduce both the number of patterns to be stored and the number of bits to be stored for each pattern, deterministic test cubes are encoded as seeds of an LFSR, and the seeds are again compressed into seeds of a folding counter sequence. The proposed BIST architecture is fully compatible with standard scan design, simple and flexible, so that sharing between several logic cores is possible. Experimental results show that the proposed scheme requires less test data storage than previously published approaches providing the same flexibility and scan compatibility.
Keywords:BIST  deterministic BIST  store and generate schemes  test data compression
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